Particle capture using transfer stamp

ABSTRACT

A micro-transfer printing system comprises a source substrate having a substrate surface and components disposed in an array on, over, or in the substrate surface Each component has a component extent in a plane parallel to the substrate surface. A stamp comprises a stamp body and stamp posts extending away from the stamp body disposed in an array over the stamp body. Each of the stamp posts has (i) a post location corresponding to a component location of one of the components when the stamp is disposed in alignment with the source substrate, and (ii) a post surface extent on a distal end of the stamp post. The post surface extent is greater than the component extent.

PRIORITY APPLICATION

This application claims the benefit of U.S. Provisional PatentApplication No. 62/883,007, filed on Aug. 5, 2019, the disclosure ofwhich is hereby incorporated by reference herein in its entirety.

TECHNICAL FIELD

The present disclosure relates to transfer printing and stamps used intransfer printing, for example micro-transfer printing.

BACKGROUND

The disclosed technology relates generally to methods and tools fortransfer printing. Conventional methods such as pick-and-place forapplying integrated circuits to a destination (target) substrate arelimited to relatively large components, for example having a dimensionof a millimeter or more, and it can be very difficult to pick up andplace ultra-thin, fragile, or small components using such conventionaltechnologies. More recently, micro-transfer printing methods have beendeveloped that permit the selection and application of such ultra-thin,fragile, or small components to a target substrate without causingdamage to the components themselves.

Micro-transfer printing enables deterministically removing arrays ofmicro-scale, high-performance components from a native source wafer,typically a semiconductor wafer on which the components are constructed,and assembling and integrating the components onto non-native targetsubstrates. In some embodiments, micro-transfer printing processes useengineered elastomer stamps coupled with high-precisionmotion-controlled print-heads to selectively pick up and print largearrays of micro-scale components from a source native wafer ontonon-native destination substrates. In some embodiments, tethers are usedto maintain position and alignment of components on a source wafer priorto the pick-up phase of a print operation and are broken or separatedduring the pick-up phase. In some embodiments, adhesion between anelastomer transfer device and a printable component can be selectivelytuned by varying the speed of a print-head.

Micro-structured stamps may be used to pick up micro components from asource substrate, transport the micro components to their destination(e.g., a destination substrate), and print the micro components onto adestination substrate. The transfer device (e.g., a micro-structuredstamp) can be created using various materials. Individual posts on atransfer device can pick up corresponding individual components and thenprint the corresponding components to their destination. Posts can bestructured in an array fashion and can have a range of heights dependingon the size of the printable material. For effective, high-yieldprinting, when picking up components, it is desirable to use a stamphaving stamp posts that are engineered to be in close contact with thecomponents (e.g., micro integrated circuits) being printed. High-yieldprinting includes low percentages of missing or misplaced components.Some print operations do result in a certain, albeit low, percentage ofmisplaced or missing components.

There is a need, therefore, for stamps and methods of printing thatfurther improve high-yields of printing components such as semiconductorcircuits and devices.

SUMMARY

While micro-transfer printing using an elastomeric stamp typically has ahigh yield, there are also commonly a small number of misprintedcomponents. Components can be misprinted because they are misplaced,misaligned, misconnected (e.g., electrically), or totally missing (e.g.,dropped during transfer or never properly picked up). Misprintedcomponents can occur in embodiments where tethers are used to maintainposition and alignment of components on a source wafer and subsequentlybroken or separated during pick up by a transfer device. It is desirableto improve the high yields of micro-transfer printing, including whentethers are used, in order to reduce or eliminate the number of repairprint operations that are needed to replace or otherwise fix misprintedcomponents.

The present disclosure includes the recognition that, in someembodiments where tethers are used, particles formed from breaking orseparating tethers can interfere with proper pick up and/or printing ofcomponents. Such particles can become airborne after formation andinterfere with, for example, subsequent print operations using the samesource wafer. For example, particles can become deposited on contactsurfaces of adjacent (or nearby) components such that adherence of stampposts during a subsequent print operation is impaired. As anotherexample, particle(s) can become deposited on a component such thatelectrical connection between the component and a destination substrateor intermediate substrate is impaired after or during printing. In yetanother example, particle(s) can become deposited on the picked-upcomponent, interfering with printing the component.

A solution that can be used in some embodiments is to use a stamp withoversized posts (relative to components being printed) such that eachpost overhangs and extends beyond its corresponding component duringpick up in a direction substantially parallel to a surface of the sourcewafer. Such posts can more readily capture particles formed duringbreaking or separating tethers during component pick up. Elastomer stampposts are well suited to capturing such particles because the particleswill generally readily adhere thereto and particle capture can occurwhile print operations proceed as normal. In some embodiments, poststhat are oversized specifically over a pre-determined tether locationcan be used. Posts can be cleaned between print operations to removeadhered particles and thereby be prepared for subsequent prints.Embodiments of the present disclosure provide systems, methods, anddevices for reducing or capturing transfer printing (e.g.,micro-transfer printing) particulate contamination, thereby increasingthe transfer printing yield.

In certain embodiments of the present disclosure, a micro-transferprinting system comprises a source substrate having a substrate surface,components disposed in an array on, over, or in the substrate surface,each component having a component extent in a plane parallel to thesubstrate surface, a stamp comprising a stamp body and stamp postsextending away from the stamp body and disposed in an array over thestamp body, each of the stamp posts having (i) a post locationcorresponding to a component location of one of the components when thestamp is disposed in alignment with the source substrate, and (ii) apost surface extent on a distal end of the stamp post, wherein the postsurface extent is greater than the component extent. The post surfaceextent can be greater than or equal to 105% (e.g., greater than or equalto 110%, greater than or equal to 120%, greater than or equal to 150%,or greater than or equal to 200%) of the component extent.

In some embodiments, each of the components is spaced apart from eachnearest-neighbor component by at least a component separation distanceand each of the stamp posts is spaced apart from each nearest-neighborstamp post by at most a post separation distance, and the postseparation distance is less than the component separation distance.

Some embodiments of a micro-transfer printing system comprisesacrificial portions disposed in an array over the source substrate and(i) each of the components is disposed completely over a differentcorresponding sacrificial portion of the sacrificial portions and (ii)each different corresponding sacrificial portion has a sacrificialportion extent (e.g., an area) greater than the component extent. Thepost surface extent can be less than the sacrificial portion extent.

In some embodiments of the present disclosure, each of the stamp postsextends at least one quarter of a distance (e.g., at least half of thedistance or at least three quarters of the distance) from each componentedge of one of the components to a corresponding sacrificial portionedge of the different corresponding sacrificial portions. The postsurface extent can be less than or equal to 90% (e.g., less than orequal to 80%, less than or equal to 70%, less than or equal to 60%, lessthan or equal to 50%, less than or equal to 40%, less than or equal to30%, or less than or equal to 20%) of the sacrificial portion extent.The post surface extent can be greater than or equal to the sacrificialportion extent or the post surface extent can cover the sacrificialportion extent.

According to some embodiments of the present disclosure, any one or allof (i) the sacrificial portions are laterally separated by anchors, (ii)each component in the array of components is physically connected to oneof the anchors with a tether, and (iii) each of the stamp posts extendsover at least a portion of the tether physically connecting the one ofthe components to the one of the anchors. In some embodiments, thesacrificial portions are laterally separated by anchors and each of thestamp posts extends laterally at least partially over a correspondinganchor of the anchors when the stamp is disposed in alignment with thesource substrate.

In some embodiments, each of the stamp posts comprises a lateral postprotrusion. The lateral post protrusion can extend at least partiallyover the corresponding tether or can extend at least partially over thecorresponding anchor when the stamp is disposed in alignment with thesource substrate, or both. According to some embodiments of the presentdisclosure, each of the components is physically connected to a tetherand the lateral post protrusion is sized and shaped to extend laterallyover at least a portion of or all of the tether. The lateral postprotrusion can have a length-to-width aspect ratio of at least 0.5(e.g., at least 1.0, 1.5 or 2.0).

In some embodiments, each of the stamp posts comprises a step. The stepcan extend laterally beyond each edge of the distal end of the stamppost. In some embodiments, each of the stamp posts comprises a step andthe step comprises a lateral post protrusion.

According to some embodiments of the present disclosure, a method ofmicro-transfer printing comprises: providing a source substratecomprising sacrificial portions disposed in an array over the sourcesubstrate, the sacrificial portions laterally separated by anchors;providing a component disposed directly on or over each of thesacrificial portions and physically connected to an anchor with atether, each component having a component extent and spaced apart from aneighboring component by a component separation distance; providing astamp comprising a stamp body and stamp posts extending away from thestamp body and disposed in an array over the stamp body, each of thestamp posts having a post surface extent on a distal end of the stamppost, wherein the post surface extent is greater than the componentextent; positioning the stamp to locate each stamp post in alignmentwith a corresponding component and pressing each of the stamp postsagainst the corresponding component to adhere the correspondingcomponent to the stamp post; and removing the stamp from the sourcesubstrate, thereby fracturing the tether physically connecting thecorresponding component and making particles (e.g., discrete grains)that subsequently adhere to the stamp. According to some embodiments,the method comprises: providing a destination substrate; transferringthe stamp and adhered components to the destination substrate; pressingthe components to the destination substrate with the stamp, to adherethe components to the destination substrate; and removing the stamp. Thestamp can be cleaned to remove the particles from the stamp afterremoving the stamp. In some methods, at least a portion of the particlesadhere to the distal end of the stamp post (e.g., on a post surface thatcontacts the corresponding component at the distal end of the stamppost, for example on a portion of the distal end that overhangs orextends beyond the picked-up component). The stamp post can comprise astep and at least a portion of the particles adhere to the step.

According to some methods, the stamp post comprises a lateral protrusionand positioning the stamp comprises positioning the lateral protrusionover one of the at least one tether, wherein at least a portion of theparticles adhere to the lateral protrusion.

According to some embodiments of the present disclosure, a method oftransfer printing a component comprises providing a stamp comprising astamp post, the stamp post having a post surface extent on a distal endof the stamp post; providing a component disposed on a source substrate,wherein the component is physically connected to the source substrate byat least one tether and the component has a component extent that issmaller than the post surface extent; and removing the component fromthe source substrate, wherein removing the component comprisescontacting the component to the stamp post and breaking (e.g.,fracturing) or separating the at least one tether thereby causingparticles (e.g., discrete grains) to form, and wherein at least aportion of the particles adhere to the stamp post while the stamp postis in contact with the component. At least a portion of the particlescan adhere to the distal end of the stamp post while the stamp post isin contact with the component (e.g., on a post surface that contacts thecorresponding component at the distal end of the stamp post, for exampleon a portion of the distal end that overhangs or extends beyond thepicked-up component).

According to some embodiments, the stamp post comprises a step and atleast a portion of the particles adhere to the step while the stamp postis in contact with the component. The stamp post can comprise a lateralpost protrusion and the method can comprise positioning the lateral postprotrusion over one of the at least one tether, wherein at least aportion of the particles adhere to the lateral protrusion while thestamp post is in contact with the component.

According to some embodiments, a method comprises: transferring thecomponent from the source substrate to a destination substrate; pressingthe component to the destination substrate; and separating the stampfrom the component, wherein at least a portion of the particles are madeairborne as a result of the separation and subsequently adhere to thestamp post. The method can comprise cleaning the stamp to remove the atleast a portion of the particles from the stamp after removing thestamp.

In some embodiments, a sacrificial portion is disposed between thecomponent and the source substrate and the method comprises etching thesacrificial portion so that the component is suspended over the sourcesubstrate by the at least one tether, each of the at least one tetherbeing connected to an anchor adjacent to the sacrificial portion.

According to some embodiments of the present disclosure, a stamp formicro-transfer printing comprises a stamp body and stamp posts extendingaway from the stamp body disposed in an array over the stamp body,wherein each of the stamp posts comprises a lateral post protrusion, astep, or both a lateral post protrusion and a step. The step can extendlaterally beyond each edge of the distal end of the stamp post. Thelateral post protrusion can have a length-to-width aspect ratio of atleast 0.5 (e.g., at least 1.0, 1.5 or 2.0).

BRIEF DESCRIPTION OF THE DRAWINGS

The foregoing and other objects, aspects, features, and advantages ofthe present disclosure will become more apparent and better understoodby referring to the following description taken in conjunction with theaccompanying drawings, in which:

FIG. 1A is a cross section of a micro-transfer printing system havingstamp areas and sacrificial areas of the same size according toillustrative embodiments of the present disclosure;

FIG. 1B is a plan view corresponding to the micro-transfer printingsystem of FIG. 1A and illustrating cross-section line A along which FIG.1A is illustrated;

FIG. 1C is a plan view of a system having stamp areas and sacrificialareas of different sizes according to illustrative embodiments of thepresent disclosure;

FIG. 2A is a cross section of a component structure according toillustrative embodiments of the present disclosure;

FIG. 2B is a plan view corresponding to the component structure of FIG.2A and illustrating cross-section line A along which FIG. 2A isillustrated;

FIG. 3A is a plan view of a stamp according to illustrative embodimentsof the present disclosure;

FIG. 3B is a perspective of a stamp corresponding to FIG. 3A accordingto illustrative embodiments of the present disclosure;

FIGS. 3C-3E are plan views of stamps with a stamp post protrusion over acomponent structure according to illustrative embodiments of the presentdisclosure;

FIG. 4A is a cross section of a stamp with a step according toillustrative embodiments of the present disclosure;

FIG. 4B is a bottom view of the stamp with the step of FIG. 4A accordingto illustrative embodiments of the present disclosure;

FIG. 5 is a perspective of a stamp with a stamp post step and a stamppost protrusion according to illustrative embodiments of the presentdisclosure;

FIG. 6 is a flow diagram illustrating methods in accordance withembodiments of the present disclosure;

FIG. 7 is a cross section of a stamp, component, and source substratewith fractured tethers and contaminating particles useful inunderstanding embodiments of the present disclosure;

FIG. 8 is a cross section of a stamp, component, and source substratewith fractured tethers and captured particles according to illustrativeembodiments of the present disclosure;

FIG. 9A-9C are sequential cross sections of a stamp, component, anddestination substrate with fractured tethers and captured particlesaccording to illustrative embodiments of the present disclosure; and

FIGS. 10A-10C are sequential cross sections of a cleaning surface andstamp with captured particles according to illustrative embodiments ofthe present disclosure.

Features and advantages of the present disclosure will become moreapparent from the detailed description set forth below when taken inconjunction with the drawings, in which like reference charactersidentify corresponding elements throughout. In the drawings, likereference numbers generally indicate identical, functionally similar, orstructurally similar elements. The figures are not necessarily drawn toscale since the variation in size of various elements in the Figures istoo great to permit depiction to scale.

DETAILED DESCRIPTION OF CERTAIN EMBODIMENTS

The present disclosure provides structures and methods that enable,inter alia, transfer printing of components from a source substrate to atarget substrate with improved transfer yields (and reduced transferfailures) providing a more robust manufacturing process with improvedproduct yield (e.g., reducing or eliminating the need for repair printoperation). Transfer printing can be micro-transfer printing, componentscan be micro-components, for example having at least one of a length orwidth less than or equal to 200 microns, and a source substrate can be anative component source wafer, such as a semiconductor wafer, having anextensive surface, for example having a dimension (for example adiameter) greater than or equal to 10 cm, 15 cm, 20 cm, 25 cm, 30 cm, 40cm, or even larger. Target substrates can be any destination substrate,such as a display substrate, and can comprise any useful substratematerial, such as glass, ceramic, metal, or polymer. A target substratecan be an intermediate substrate, for example used as part of a compoundmicro assembly process. Components can be formed on a source substrate,contacted by a stamp to pick up and remove them from the sourcesubstrate and adhere them to the stamp, and pressed against a targetsubstrate to adhere the components to a target substrate. The stamp isthen moved away from the target substrate, leaving the components on thetarget substrate. The pickup-and-print process (print operation) can berepeated (e.g., many times) with the stamp to transfer differentcomponents on the source substrate to the target substrate.

Referring to FIGS. 1A and 7 , in some embodiments of transfer printingaccording to the present disclosure, components 20 are released from asource substrate 10 by undercutting components 20, for example byetching a sacrificial portion 12 of source substrate 10 on or over whichcomponents 20 are formed or otherwise disposed to form a space (e.g., agap 12), such that components 20 are attached by a tether 14 to ananchor 16 of source substrate 10. (One or more tethers 14 can be used,for example in combination with one or more anchors 16.) Sacrificialportions 12 disposed in an array over source substrate 10 can bedisposed in, on, or over source substrate 10 and, moreover, suchsacrificial portions 12 can be designated portions of the sourcesubstrate 10 itself (e.g., an anisotropically etchable source substrate10).

When components 20 are removed from source substrate 10 by a stamp 30,tethers 14 attaching each component 20 to an anchor 16 are broken (e.g.,fractured) or separated from anchor 16, forming fractured or separatedtethers 14A (shown in FIG. 7 ). According to some embodiments, theprocess of breaking (e.g., fracturing) tethers 14 or separating tethers14 from anchors 16 can create particles 18 that contaminate stamp 30,components 20, source substrate 10, or a target substrate (not shown inFIGS. 1A and 7 ). The particle contamination can inhibit picking upcomponents 20 from source substrate 10 or inhibit printing picked-upcomponents 20 on stamp 30 to the target substrate. For example, particlecontamination can cause misplacement, misalignment, or misconnection(e.g., electrical misconnection). Particle contamination can alsoinhibit the subsequent transfer of components 20 from source substrate10 to a target substrate, thereby causing transfer failures and reducingtransfer yields for transfer-printing operations.

According to some embodiments of the present disclosure and asillustrated in FIG. 8 , transfer yields can be improved by capturing atleast some particles 18 with an enlarged stamp 30 with a greater extent(e.g., area) over substrate surface 11 of source substrate 10. Such agreater extent can cause contaminating particles 18 to adhere toenlarged portions of stamp 30 (thereby becoming captured particles 19).After one or more print operations with stamp 30, stamp 30 can becleaned to remove captured particles 19 from stamp 30. Thus, in someembodiments, captured particles 19 may be allowed to be build up near aperiphery of a contact surface of posts 34 to reduce time spent cleaningstamp 30 while still improving printing yields through particle capture19.

Therefore, according to some illustrative embodiments of the presentdisclosure and referring again to the cross section of FIG. 1A and thecorresponding plan views of FIGS. 1B and 1C, a micro-transfer printingsystem 99 comprises a source substrate 10 having a substrate surface 11and components 20 disposed in an array on, over, or in the substratesurface 11 of source substrate 10. Each component 20 has a componentextent (e.g., area) in a plane parallel to substrate surface 11, forexample a component length 20L of component 20 times a component width20W of component 20 (shown in FIGS. 1B and 1C). The component extent(e.g., area) can include all of the elements or components of component20 (e.g., semiconductor materials, metal layers, electrical conductors,optical conductors, vias, contact pads, and dielectric structures) butdoes not include tether 14 or anchor 16.

An example of a stamp 30 comprises a stamp body 32 and stamp posts 34extending away from stamp body 32 disposed in an array over stamp body32. Stamp body 32 can comprise the same material as stamp post 34 andcan be made in a common molding step. During a print operation, eachstamp post 34 has a post location corresponding to and aligned with acomponent location of a component 20 on source substrate 10 so thatstamp posts 34 can each contact a component 20 when stamp 30 is movedtowards source substrate 10. A post surface of a distal post end 34D ofeach stamp post 34 has a post surface extent (e.g., area). The postsurface extent of stamp post 34 can be over and substantially parallelto substrate surface 11 of source substrate 10. As shown in FIGS. 1B and1C, the post surface extent can be a post length 34L of stamp post 34times a post width 34W of stamp post 34, for example if the post surfaceis a flat rectangular surface. Distal post end 34D of stamp post 34 isopposite and remote from a proximal post end 34P of stamp post 34 andproximal post end 34P is in contact with or adjacent to stamp body 32.Note that, as used herein, post length 34L is not the distance betweenthe proximal post end 34P and distal post end 34D (e.g., a height ofstamp post 34).

Components 20 are separated in a horizontal direction DH by horizontalcomponent separation distance 20H and separated in a vertical directionDV orthogonal to horizontal direction DH by vertical componentseparation distance 20V. Similarly, stamp posts 34 are separated inhorizontal direction DH by horizontal post separation distance 34H andseparated in vertical direction DV orthogonal to horizontal direction DHby vertical post separation distance 34V. Either or both of horizontaland vertical component separation distance 20H, 20V are a componentseparation distance and can be the smallest separation distance betweenadjacent components 20. Adjacent components 20 are nearest-neighbor(e.g., adjoining or adjacent) components 20 between which there are noother components 20 in a corresponding direction (e.g., a horizontal orvertical direction). Likewise, either or both of horizontal and verticalpost separation distance 34H, 34V are a post separation distance and canbe the smallest separation distance between adjacent stamp posts 34.Adjacent stamp posts 34 are nearest-neighbor stamp posts 34 betweenwhich there are no other stamp posts 34 in a corresponding direction(e.g., a horizontal or vertical direction). A post surface extent ofdistal post end 34D of stamp post 34 can be greater than a componentextent and a post separation distance can be less than a componentseparation distance in either or both of horizontal and verticaldirections DH, DV. (As will be understood by those knowledgeable in theart, ‘horizontal’ and ‘vertical’ are arbitrary designations and can beinterchanged.) Thus, portions of a distal end of stamp posts 34 can beexposed (for example over gap 12) and are not in contact with components20 or substrate surface 11. Exposed portions of stamp post 34 can becontacted by particles 18 when tethers 14 break (e.g., fracture) orseparate and particles 18 adhere or stick to the exposed stamp post 34portion thereby becoming captured particles 19, so that the capturedparticles 19 do not contaminate other portions of, for example, stamp30, components 20, substrate surface 11, or target substrates.

Referring also to the more detailed illustration of components 20 in thecross section of FIG. 2A taken along cross section line A of the planview of FIG. 2B, each component 20 can comprise a semiconductorstructure 22 (for example comprising one or more of a circuit,electrical conductors, patterned metal layers, dielectric layers, vias,etc., such as are found in integrated circuits) and electrical contactpads 24 that can connect electrodes (not shown) to any circuit formed insemiconductor structure 22. Patterned dielectric layers, structures, orencapsulants 26 can electrically insulate semiconductor structure 22 andcontact pads 24. Dielectric encapsulant 26 can form tethers 14 or anchor16, or a portion of tethers 14 and anchor 16. In some embodiments,tether 14 or anchors 16 can instead or in addition comprise portions ofsemiconductor structure 22 or source substrate 10, for examplesemiconductor materials.

As shown in FIGS. 1A-1C, each component 20 can be disposed completelyover a different corresponding sacrificial portion 12 (comprising a gap12 when sacrificial portions 12 are etched) of source substrate 10 sothat no portion of a component 20 extends beyond the correspondingsacrificial portion 12 in a direction parallel to substrate surface 11.Thus, component edges 20E defining edges of component 20 demarcating thecomponent extent are within (or congruent with) a sacrificial portion 12area demarcated by sacrificial portion edges 12E. The distance betweencomponent edges 20E in the horizontal direction define component length20L and the distance between component edges 20E in the verticaldirection define component width 20W (or vice versa). Referring to FIGS.1A and 1B, in some embodiments of the present disclosure, stamp post 34is aligned with and has a post surface extent similar to or the same asan extent (e.g., area) of sacrificial portion 12. Referring to FIG. 1C,in some embodiments of the present disclosure, stamp post 34 has a postsurface extent less than an extent (e.g., area) of sacrificial portion12 but greater than the component extent.

Thus, according to some embodiments of the present disclosure, a postsurface extent is greater than or equal to 105% of a component extent(e.g., greater than or equal to 110%, greater than or equal to 120%,greater than or equal to 150%, or greater than or equal to 200% of thecomponent extent). Similarly, according to some embodiments of thepresent disclosure, a post surface extent is equal to or less than 100%of a sacrificial portion extent (e.g., equal to or less than 90%, equalto or less than 80%, equal to or less than 70%, equal to or less than60%, equal to or less than 50%, equal to or less than 40%, equal to orless than 30%, or equal to or less than 20% of the sacrificial portionextent). According to some embodiments of the present disclosure, stamppost 34 extends at least one quarter of the way from a component edge20E to a sacrificial portion edge 12E above which component 20 isdisposed (e.g., at least one half of the way from component edge 20E tosacrificial portion edge 12E, or at least three quarters of the way fromcomponent edge 20E to sacrificial portion edge 12E of sacrificialportion 12 above which component 20 is disposed).

In some embodiments, and as shown in FIGS. 1A-1C, a post surface extentis equal to (as shown in FIGS. 1A, 1B) or less than (as shown in FIG.1C) a sacrificial portion extent. In some embodiments of the presentdisclosure, the post surface extent is greater than the sacrificialportion extent. Although it is possible in some such cases that intransfer printing a component 20 from source substrate 10 stamp post 34can contact anchors 16, such embodiments can have the advantage ofcompletely covering sacrificial portions 12 even in the event of atleast a partial misalignment between stamp posts 34 and components 20,so that particles 18 can be effectively trapped and captured by stamp 30thereby becoming captured particles 19. For example, edges of stamp post34 can extend at least 500 nm (e.g., at least one micron, two microns,five microns, ten microns, twenty microns, fifty microns, or 100microns) beyond sacrificial portion edges 12E in any one or moredirection(s) substantially parallel to substrate surface 11. Stamp postsurface of stamp posts 34 can have a similar shape to an extent ofcomponent 20 (e.g., both being rectangular) or a different shape (e.g.,one being rectangular and the other being circular).

In some embodiments of the present disclosure, stamp posts 34 as shownin FIGS. 1A-1C have a rectangular cross section parallel to substratesurface 11. In some embodiments, stamp posts 34 have a non-rectangularcross section parallel to substrate surface 11, for example a polygonal,circular, oval, elliptical shape, or a shape whose perimeter comprisesstraight or curved line segments at any angle and of any number.Referring to FIGS. 3A-3D, in some embodiments of the present disclosure,distal post ends 34D of stamp posts 34 comprise a portion (e.g., arectangular portion) that extends primarily over component 20 (or othersubstantial portion of any shape that extends primarily over component20) and a lateral post protrusion 38 that protrudes (e.g., extends) fromthe rectangular portion in a direction parallel to substrate surface 11,for example at least partially over tether 14. FIG. 3A is a bottom viewand FIG. 3B is a perspective of a stamp 30 with a two-by-three array ofstamp posts 34, each having a lateral post protrusion 38. Lateral postprotrusion 38 can, but does not necessarily, have a rectangular shape,and can have a width 38W that is less than a post width 34W of stamppost 34 or a length 38L that is less than a post length 34L of stamppost 34, or both, as shown in FIGS. 3A and 3B. Lateral post protrusion38 can have a length-to-width aspect ratio of, for example, at least0.5, 1.0, 1.5, or 2.0 and can have a size and shape selected forcapturing particles 18 (e.g., based on particular tethers 14 with whichstamp 30 is designed to be used).

FIG. 3C illustrates stamp post 34 in accordance with FIGS. 3A and 3B inalignment with component 20. Lateral post protrusion 38 is aligned withtether 14 so that lateral post protrusion 38 is disposed over tether 14when stamp post 34 contacts component 20 and fractures tether 14. Bydisposing lateral post protrusion 38 over tether 14 when tether 14 isbroken (e.g., fractured) or separated, particles 18 that are formed bythe breaking or separating can adhere to lateral post protrusion 38 orto other portions of the distal end of stamp post 34. Stamp post 34 canextend over the sides (e.g., component edges 20E) of component 20 on anyone or more of the sides, including over the sides of lateral postprotrusion 38, as shown in FIGS. 3C and 3D. FIG. 3C illustrates lateralpost protrusion 38 extending over the entire tether 14 up to anchor 16;in some embodiments, such as that of FIG. 3D, lateral post protrusion 38extends over only a portion of tether 14. In FIG. 3E, lateral postprotrusion 38 extends entirely over tether 14 and lateral postprotrusion 38 has a width equal to that of component 20. In someembodiments, and as shown in FIG. 3E, stamp post 34 has a width equal tothat of component 20, does not extend beyond component 20 on anon-tether end of component 20, and extends entirely over tether 14.Some embodiments according to FIG. 3E can have the advantage ofproviding a particle 18 trapping surface of stamp post 34 near to tether14 without affecting portions of component 20 or stamp post 34 remotefrom tether 14. A cross section corresponding to cross section line A ofFIGS. 3C-3E is illustrated in the component 20 cross section of FIG. 2Aand (including stamp 30) in the cross section of FIG. 1A.

According to some embodiments of the present disclosure, adjacentstructures are structures between which no other structure is disposed,or no other structure is closer to both the adjacent structures. As isthe case for the terms ‘horizontal’ and ‘vertical’, the terms ‘length’and ‘width’ are generally arbitrary and can be exchanged, although‘length’ often refers to the longer of the two dimensions of a surfaceor structure in comparison to ‘width.’ In any case, the appellations‘length’ and ‘width’ can be exchanged and do not limit the particularembodiments of the present disclosure that they describe.

In some embodiments of the present disclosure, stamp posts 34 extendover at least a portion of anchors 16 of source substrate 10 and cancontact anchors 16 when picking up components 20 with stamp 30. In someembodiments, stamp posts 34 extend over but do not contact anchors 16.Note that anchors 16 can refer to portions of source substrate 10 thatare not sacrificed (are not sacrificial portion 12) and can thereforesurround sacrificial portion 12, as shown in FIGS. 1B-1C. Referring toFIGS. 4A, 4B, and 5 , stamp posts 34 comprise a step 36 that extendsfrom stamp body 32 only part of the way to distal post end 34D. Step 36can be formed in a common molding step as post 34, after post 34 isformed, or as part of a two-step process in which a mesa is formed andthen a second portion of post 34 is formed thereon. As shown in FIG. 4Band FIG. 5 , step 36 can surround the distal post end 34D of stamp post34. Because step 36 is shorter than stamp post 34 it does notnecessarily contact anchor 16 when distal post end 34D contactscomponents 20 but can capture particles 18, thereby reducing particulatecontamination in the system (e.g., more effectively than stamp body 32can). In some embodiments, step 36 can comprise a step lateral postprotrusion 38S. Step 36 can have a height that is no more than tenmicrons (e.g., no more than one micron, two microns, or five microns)less than a height of stamp post 34. Step 36 can have a height that isno less than 50% (e.g., no less than 90%, 80%, 70%, or 60%) of theheight of stamp post 34. Step 36 can extend greater than or equal to onemicron (e.g., greater than or equal to two microns, five microns, tenmicrons, 20 microns, 50 microns, 100 microns, or 250 microns) beyondstamp post 34 in a direction parallel to substrate surface 11. Step 36can have an extent (e.g., area) at least 110% (e.g., at least 120%, 150%or 200%) of a post surface extent.

According to some embodiments of the present disclosure and asillustrated in FIG. 6 , a method of micro-transfer printing comprisesproviding a source substrate 10 comprising sacrificial portions 12disposed in an array over source substrate 10 in step 100. Sacrificialportions 12 can be laterally separated by anchors 16. A component 20 isdisposed directly on or over each sacrificial portion 12 and isphysically connected to an anchor 16 with a tether 14 in step 110. Eachcomponent 20 has a component extent and is spaced apart from an adjacentcomponent 20 by a component separation distance (e.g., a horizontalcomponent separation distance 20H or a vertical component separationdistance 20V). In step 120, a stamp 30 comprising a stamp body 32 andstamp posts 34 extending away from the stamp body 32 disposed in anarray over stamp body 32 is provided. Each stamp post 34 has a postlocation corresponding to a component location of a component 20 and apost surface of a distal post end 34D having a post surface extent on adistal post end 34D of stamp post 34. The post surface extent is greaterthan the component extent. Each stamp post 34 is pressed against acorresponding component 20 in step 130 to adhere the correspondingcomponent 20 to the stamp post 34. In step 140, stamp 30 is removed fromsource substrate 10, thereby breaking (e.g., fracturing) or separatingtethers 14 and making particles 18 that, in step 150, adhere to stamp30, for example at stamp post 34.

In some embodiments of the present disclosure and as also illustrated inFIGS. 9A-9C, a target (e.g., destination) substrate 40 is provided instep 160. Stamp 30 with adhered components 20 are transferred to targetsubstrate 40 (as shown in FIG. 9A) and components 20 are pressed totarget substrate 40 with stamp 30 in step 170 (as shown in FIG. 9B) toadhere components 20 to target substrate 40 while captured particles 19remain adhered to stamp 30 and stamp 30 is removed in step 180 (as shownin FIG. 9C). Referring to FIGS. 10A-10C, stamp 30 is transported to acleaning surface 52 of a cleaning substrate 50 (e.g., an adhesive tape),as shown in FIG. 10A. In step 190 and as shown in FIG. 10B, stamp 30 iscleaned to remove captured particle 19 from stamp 30, for example bypressing stamp posts 34 against a cleaning surface 52 of a cleaningsubstrate 50. (As other examples, stamp posts 34 could be cleaned with afluid or plasma.) Cleaned stamp 30 is then removed, leaving capturedparticles 19 adhered to cleaning substrate 50, as shown in FIG. 10C. Insubsequent cleaning steps, different portions of cleaning surface 52 ofcleaning substrate 50 can be used to clean stamp 30 to avoid contactingcaptured particles 19 on cleaning surface 52 to stamp posts 34. Stampposts 34 with steps 36 can be cleaned, for example, in an ultrasonicbath.

The method illustrated in FIG. 6 can be repeated by iteratively pressingstamp 30 against different components 20 on source substrate 10 in step130 and transferring them to target substrate 40 in step 170. Forexample, stamp 30 can be shifted relative to unprinted components 20 onsource substrate 10 by a component separation distance betweenprintings. Stamp 30 can be cleaned in step 190 after every transfer, asshown in FIG. 6 , or after more than one print step (not shown in FIG. 6).

According to some embodiments of the present disclosure, a stamp 30 fortransfer printing (e.g., micro-transfer printing) comprises a stamp body32 and stamp posts 34 extending away from stamp body 32 disposed in anarray over stamp body 32. Each stamp post 34 has a non-rectangulardistal end (for example as shown in FIGS. 3A-3D and FIG. 5 ) or a step36 distal end (for example as shown in FIGS. 4A, 4B and 5 ). In someembodiments, step 36 surrounds the distal end of each stamp post 34 sothat the step extends laterally beyond each edge of the post surface34D, as shown in FIGS. 4B and 5 . In some embodiments, the distal end ofeach stamp post 34 has a post length 34L and a post width 34W andcomprises a lateral post protrusion 38 in a direction of post length 34Lhaving a post protrusion width 38W less than the post width 34W.

Such printed structures enable low-cost, high-performance arrays ofelectrically connected components such as integrated circuits ormicro-light-emitting diodes (micro-LEDs) useful, for example, in displaysystems. For example, components 20 can be micro-assembled arrays ofmicro-components, such as integrated circuits or micro-LEDs, that aretoo small (e.g., with at least one of a width, length, height, anddiameter of 0.5 μm to 50 μm such as a width of 1-8 μm, a length of 5-10μm or a height of 0.5-3 μm), numerous, or fragile to be assembled byconventional means. Rather, these arrays are assembled usingtransfer-printing technology (e.g., micro-transfer-printing technology).Components 20 may be prepared on a native source substrate 10 andprinted to a target (destination) substrate 40 (e.g., plastic, metal,glass, ceramic, sapphire, transparent materials, opaque materials, rigidmaterials, or flexible materials), thereby obviating the manufacture ofcomponents 20 on target substrate 40. Components 20 (e.g.,micro-components or chiplets) can be small integrated circuits, can beunpackaged dies released from a source substrate 10, and can bemicro-transfer printed. Components 20 can have, for example, one or moreof a width from 1-8 μm, a length from 5-10 μm, and a height from 0.5-3μm. Transfer-printable components 20 can have at least one of a width,length, and height from 2 to 1000 μm (e.g., 2 to 5 μm, 5 to 10 μm, 10 to20 μm, 20 to 50 μm, 50 μm to 100 μm, 100 μm to 250 μm, 250 μm to 500 μm,or 500 μm to 1000 μm). Components 20 can have a doped or undopedsemiconductor substrate, for example having a thickness of 2 to 50 μm(e.g., 2 to 5 μm, 5 to 10 μm, 10 to 20 μm, or 20 to 50 μm). Components20 can be integrated circuits with a length greater than width, forexample having an aspect ratio greater than or equal to 2 (e.g., greaterthan or equal to 4, 8, 10, 20, or 50) and, optionally, component contactpads 24 that are adjacent to the ends of transfer-printable components20 along the length of the transfer-printable components 20. In someembodiments, components 20 are electrically connected to targetsubstrate 40 using connection posts (not shown). Examples of connectionposts are described in U.S. patent application Ser. No. 14/822,864 andU.S. Pat. No. 10,262,966, the disclosures of which are each herebyincorporated by reference in its entirety.

A micro-transfer printable component 20 can be an active electricalcomponent, for example including one or more active elements such aselectronic transistors or diodes. Transfer-printable components 20 canbe electronic processors, controllers, drivers, light-emitters, sensors,light-control components, or light-management components.Transfer-printable components 20 can be integrated circuits, for exampleCMOS integrated circuits made on or in a silicon semiconductor sourcesubstrate 10 (a wafer), light-emitting diodes (LEDs) or lasers, forexample made on or in a GaN semiconductor source substrate 10 (a wafer),or silicon photodiodes. Alternatively, transfer printable component 20can be a passive component, for example including one or more passiveelements such as resistors, capacitors, or conductors such as electricaljumpers. In some embodiments, transfer printable component 20 is acompound micro-transfer printable component 20 that includes both activeand passive elements. Transfer-printable component 20 can be asemiconductor component 20 having one or more semiconductor layers, suchas an integrated circuit or chiplet. Transfer-printable component 20 canbe an unpackaged die. In some embodiments, transfer-printable component20 is a compound element having a plurality of active or passiveelements, such as multiple semiconductor components with separatesubstrates, each with one or more active elements or passive elements,or both. In certain embodiments, the plurality of elements is disposedand interconnected on a compound-element substrate separate from thesubstrates of any semiconductor components or a different substrate. Thecompound element can be transfer printed itself after the elements havebeen arranged and interconnected thereon.

Printable component structures can be made in a semiconductor sourcesubstrate 10 (e.g., a silicon or GaN wafer) having a process side and aback side used to handle and transport the wafer. Transfer-printablecomponents 20 are formed using lithographic processes in an active layeron or in the process side of a source substrate 10. An empty releaselayer space (sacrificial portion 12) is formed beneathtransfer-printable components 20 with tethers 14 connectingtransfer-printable components 20 to anchors 16 on source substrate 10 insuch a way that pressure applied against transfer-printable components20 breaks tethers 14 to release transfer-printable components 20 fromsource substrate 10 (e.g., with stamp 30). Methods of forming suchstructures are described, for example, in U.S. Pat. No. 8,889,485.Lithographic processes for forming transfer-printable components 20 insource substrate 10, for example transistors, wires, and capacitors, arefound in the integrated circuit art.

According to some embodiments of the present disclosure, a sourcesubstrate 10 can be a source wafer, for example a semiconductor wafersuch as a crystalline silicon or compound semiconductor wafer, or aglass, sapphire, quartz, or polymer substrate or any substrate materialcapable of supporting transfer-printable components 20. Source substrate10 can have a diameter greater than or equal to 10 cm (e.g., greaterthan or equal to 15 cm, 20 cm, 25 cm, 30 cm, 40 cm) or even larger.Source substrate 10 can have opposing substantially parallel sides andcomponents 20 can be disposed on one of the sides. Source substrate 10can be thin for example having a thickness of less than one mm (e.g.,less than or equal to 700 microns, 500 microns, or 100 microns), or canbe relatively thicker, for example having a thickness of one mm or more(e.g., two mm or more, or five mm or more).

Micro-structured stamps 30 (e.g., elastomeric stamps, visco-elasticstamps, PDMS stamps, electrostatic stamps, or hybridelastomeric/electrostatic stamps) can be used to pick up components 20,transport components 20 to target (destination) substrate 40, and printcomponents 20 onto target substrate 40. In some embodiments, surfaceadhesion forces are used to control the selection and printing ofcomponents 20 onto target substrate 40. In some embodiments, otherforces adhere components 20 to stamp 30 (e.g., in combination withadhesive forces), for example electro-static or magnetic forces. Thisprocess may be performed massively in parallel. Stamps 30 can bedesigned to transfer a single component 20 or hundreds to thousands ofdiscrete components 20 in a single pick-up and print operation. For adiscussion of embodiments of micro-transfer printing generally, see U.S.Pat. Nos. 7,622,367 and 8,506,867, each of which is hereby incorporatedby reference in its entirety. Stamps 30 can be constructed byphotolithographically defining a master mold against which liquidmaterial (e.g., PDMS) is cast and solidified to form stamp 30. Stamp 30is then removed from the master mold. Stamp 30 can have a rigid back towhich stamp body 32 is adhered, for example a transparent rigid backcomprising glass, on an opposite side of stamp body 32 from which stampposts 34 extend.

The target (e.g., destination substrate 40 can be glass (for example aportion of a flat-panel display substrate), soda-lime glass,borosilicate glass, pyrex, metal, ceramic, polymer, or a semiconductor(for example a wafer or portion of a wafer). Target substrate 40 canhave a thickness ranging from 0.5 mm to 10 mm. These ranges areillustrative and not limiting and other materials and sizes can beincluded or used.

According to various embodiments of the present disclosure, a nativesource substrate 10 can be provided with the transfer-printablecomponent 20, sacrificial portions 12, and tethers 14 already formed, orthey can be constructed as part of the process of the presentdisclosure.

Source substrate 10 and transfer-printable components 20, stamp 30, andtarget (destination) substrate 40 can be made separately and atdifferent times or in different temporal orders or locations andprovided in various process states.

In comparison to thin-film manufacturing methods, using denselypopulated source substrates 10 and transferring micro-transfer printablecomponents 20 to a target substrate 40 that requires only a sparse arrayof micro-transfer printable components located thereon with a stamp 30does not waste or require active layer material on a target substrate40. The present disclosure can also be used in transferringtransfer-printable components 20 made with crystalline semiconductormaterials that have higher performance than thin-film active components.Furthermore, the flatness, smoothness, chemical stability, and heatstability requirements for a target substrate 40 used in someembodiments of the present disclosure may be reduced because theadhesion and transfer processes are not substantially limited by thematerial properties of target substrate 40. Manufacturing and materialcosts may be reduced because of high utilization rates of more expensivematerials (e.g., source substrate 10) and reduced material andprocessing requirements for target substrate 40.

As is understood by those skilled in the art, the terms “over” and“under” are relative terms and can be interchanged in reference todifferent orientations of the layers, elements, and substrates includedin the present disclosure. For example, a first layer on a second layer,in some implementations means a first layer directly on and in contactwith a second layer. In other implementations a first layer on a secondlayer includes a first layer and a second layer with another layertherebetween.

Having described certain implementations, it will now become apparent toone of skill in the art that other implementations incorporating theconcepts of the disclosure may be used. Therefore, the disclosure shouldnot be limited to certain implementations, but rather should be limitedonly by the spirit and scope of the following claims.

Throughout the description, where apparatus and systems are described ashaving, including, or comprising specific components, or where processesand methods are described as having, including, or comprising specificsteps, it is contemplated that, additionally, there are apparatus, andsystems of the disclosed technology that consist essentially of, orconsist of, the recited components, and that there are processes andmethods according to the disclosed technology that consist essentiallyof, or consist of, the recited processing steps.

It should be understood that the order of steps or order for performingcertain action is immaterial so long as the disclosed technology remainsoperable. Moreover, two or more steps or actions in some circumstancescan be conducted simultaneously.

PARTS LIST

-   A cross section line-   DH horizontal direction-   DV vertical direction-   10 source substrate/source wafer-   11 substrate surface-   12 sacrificial portion/gap-   12E sacrificial portion edge-   14 tether-   14A fractured tether-   16 anchor-   18 particle-   19 captured particle-   20 component-   20E component edge-   20H horizontal component separation distance-   20L component length-   20V vertical component separation distance-   20W component width-   22 semiconductor structure-   24 contact pad-   26 dielectric encapsulant-   30 stamp-   32 stamp body-   34 stamp post-   34D distal post end/post surface-   34H horizontal post separation distance-   34L post length-   34P proximal post end-   34V vertical post separation distance-   34W post width-   36 step-   38 lateral post protrusion-   38S step lateral post protrusion-   38L protrusion length-   38W protrusion width-   40 destination substrate/target substrate-   50 cleaning substrate-   52 cleaning surface-   99 micro-transfer printing system-   100 provide source substrate step-   110 provide component step-   120 provide stamp step-   130 press stamp against component step-   140 remove stamp and component step-   150 capture particles step-   160 provide destination substrate step-   170 press component against destination substrate step-   180 remove stamp step-   190 clean stamp step

What is claimed:
 1. A micro-transfer printing system, comprising: anative component source wafer having a substrate surface; componentsdisposed in an array on, over, or in the substrate surface, eachcomponent having a component extent in a plane parallel to the substratesurface, wherein the components are native to the source wafer; a stampcomprising a stamp body and stamp posts extending away from the stampbody and disposed in an array over the stamp body, each of the stampposts having (i) a post location corresponding to a component locationof one of the components when the stamp is disposed in alignment withthe source wafer, and (ii) a post surface extent on a distal end of thestamp post; sacrificial portions disposed in an array over the sourcewafer and wherein (i) each of the components is disposed completely overa different corresponding sacrificial portion of the sacrificialportions and (ii) each different corresponding sacrificial portion has asacrificial portion extent greater than the component extent, whereinthe post surface extent is greater than the component extent, the postsurface extent is less than or equal to 90% of the sacrificial portionextent.
 2. The micro-transfer printing system of claim 1, wherein thepost surface extent is greater than or equal to 105% of the componentextent.
 3. The micro-transfer printing system of claim 1, wherein eachof the components is spaced apart from each nearest-neighbor componentby at least a component separation distance and each of the stamp postsis spaced apart from each nearest-neighbor stamp post by at most a postseparation distance, and the post separation distance is less than thecomponent separation distance.
 4. The micro-transfer printing system ofclaim 1, wherein the post surface extent is greater than or equal to thesacrificial portion extent or wherein the post surface extent covers thesacrificial portion extent.
 5. The micro-transfer printing system ofclaim 1, wherein (i) the sacrificial portions are laterally separated byanchors, (ii) each component in the array of components is physicallyconnected to one of the anchors with a tether, and (iii) each of thestamp posts extends over at least a portion of the tether physicallyconnecting the one of the components to the one of the anchors.
 6. Themicro-transfer printing system of claim 1, wherein the sacrificialportions are laterally separated by anchors and each of the stamp postsextends laterally at least partially over a corresponding anchor of theanchors when the stamp is disposed in alignment with the source wafer.7. The micro-transfer printing system of claim 6, wherein each of thestamp posts comprises a lateral post protrusion and the lateral postprotrusion extends at least partially over the corresponding anchor whenthe stamp is disposed in alignment with the source wafer.
 8. Themicro-transfer printing system of claim 1, wherein each of the stampposts comprises a step.
 9. The micro-transfer printing system of claim1, wherein each of the stamp posts comprises a lateral post protrusion.10. The micro-transfer printing system of claim 9, wherein each of thestamp posts comprises a step and the step comprises a lateral postprotrusion.
 11. The micro-transfer printing system of claim 9, whereineach of the components is physically connected to a tether and thelateral post protrusion is sized and shaped to extend laterally over atleast a portion of or all of the tether.
 12. A micro-transfer printingsystem, comprising: a source substrate having a substrate surface;components disposed in an array on, over, or in the substrate surface,each component having a component extent in a plane parallel to thesubstrate surface; a stamp comprising a stamp body and stamp postsextending away from the stamp body and disposed in an array over thestamp body, each of the stamp posts having (i) a post locationcorresponding to a component location of one of the components when thestamp is disposed in alignment with the source substrate, and (ii) apost surface extent on a distal end of the stamp post; sacrificialportions disposed in an array over the source substrate and wherein (i)each of the components is disposed completely over a differentcorresponding sacrificial portion of the sacrificial portions and (ii)each different corresponding sacrificial portion has a sacrificialportion extent greater than the component extent, wherein the postsurface extent is greater than the component extent, wherein the postsurface extent is less than the sacrificial portion extent, and whereinthe post surface extent is less than or equal to 90% of the sacrificialportion extent.
 13. A micro-transfer printing system, comprising: asource substrate having a substrate surface; components disposed in anarray on, over, or in the substrate surface, each component having acomponent extent in a plane parallel to the substrate surface; a stampcomprising a stamp body and stamp posts extending away from the stampbody and disposed in an array over the stamp body, each of the stampposts having (i) a post location corresponding to a component locationof one of the components when the stamp is disposed in alignment withthe source substrate, and (ii) a post surface extent on a distal end ofthe stamp post; sacrificial portions disposed in an array over thesource substrate and wherein (i) each of the components is disposedcompletely over a different corresponding sacrificial portion of thesacrificial portions and (ii) each different corresponding sacrificialportion has a sacrificial portion extent greater than the componentextent, wherein the post surface extent is greater than the componentextent, wherein (i) the sacrificial portions are laterally separated byanchors, (ii) each component in the array of components is physicallyconnected to one of the anchors with a tether, and (iii) each of thestamp posts extends over at least a portion of the tether physicallyconnecting the one of the components to the one of the anchors, andwherein each of the stamp posts comprises a lateral post protrusion andthe lateral post protrusion extends at least partially over acorresponding tether when the stamp is disposed in alignment with thesource substrate.
 14. A micro-transfer printing system, comprising: asource substrate having a substrate surface; components disposed in anarray on, over, or in the substrate surface, each component having acomponent extent in a plane parallel to the substrate surface; a stampcomprising a stamp body and stamp posts extending away from the stampbody and disposed in an array over the stamp body, each of the stampposts having (i) a post location corresponding to a component locationof one of the components when the stamp is disposed in alignment withthe source substrate, and (ii) a post surface extent on a distal end ofthe stamp post, wherein the post surface extent is greater than thecomponent extent, wherein each of the stamp posts comprises a step andthe step extends laterally beyond each edge of the distal end of thestamp post.
 15. The micro-transfer printing system of claim 14, whereineach of the stamp posts comprises a lateral post protrusion and the stepof the stamp post comprises a step lateral post protrusion on which thelateral post protrusion is disposed, wherein the lateral post protrusionextends at least partially over a corresponding tether when the stamp isdisposed in alignment with the source wafer.
 16. A micro-transferprinting system, comprising: a native component source wafer having asubstrate surface; components disposed in an array on, over, or in thesubstrate surface, each component having a component extent in a planeparallel to the substrate surface, wherein the components are native tothe source wafer; a stamp comprising a stamp body and stamp postsextending away from the stamp body and disposed in an array over thestamp body, each of the stamp posts having (i) a post locationcorresponding to a component location of one of the components when thestamp is disposed in alignment with the source wafer, and (ii) a postsurface extent on a distal end of the stamp post; sacrificial portionsdisposed in an array over the source wafer and wherein (i) each of thecomponents is disposed completely over a different correspondingsacrificial portion of the sacrificial portions and (ii) each differentcorresponding sacrificial portion has a sacrificial portion extentgreater than the component extent, wherein the post surface extent isgreater than the component extent, the post surface extent is less thanthe sacrificial portion extent, and each of the stamp posts extends atleast one quarter of a distance from each component edge of one of thecomponents to a corresponding sacrificial portion edge of the differentcorresponding sacrificial portions.
 17. A micro-transfer printingsystem, comprising: a native component source wafer having a substratesurface; components disposed in an array on, over, or in the substratesurface, each component having a component extent in a plane parallel tothe substrate surface, wherein the components are native to the sourcewafer; a stamp comprising a stamp body and stamp posts extending awayfrom the stamp body and disposed in an array over the stamp body, eachof the stamp posts having (i) a post location corresponding to acomponent location of one of the components when the stamp is disposedin alignment with the source wafer, and (ii) a post surface extent on adistal end of the stamp post; sacrificial portions disposed in an arrayover the source wafer and wherein (i) each of the components is disposedcompletely over a different corresponding sacrificial portion of thesacrificial portions and (ii) each different corresponding sacrificialportion has a sacrificial portion extent greater than the componentextent, wherein (i) the sacrificial portions are laterally separated byanchors, (ii) each component in the array of components is physicallyconnected to one of the anchors with a tether, and (iii) each of thestamp posts extends over at least a portion of the tether physicallyconnecting the one of the components to the one of the anchor, andwherein each of the stamp posts comprises a lateral post protrusion andthe lateral post protrusion extends at least partially over acorresponding tether when the stamp is disposed in alignment with thesource wafer.
 18. The micro-transfer printing system of claim 17,wherein the lateral post protrusion has a length-to-width aspect ratioof at least 0.5.
 19. A micro-transfer printing system, comprising: anative component source wafer having a substrate surface; componentsdisposed in an array on, over, or in the substrate surface, eachcomponent having a component extent in a plane parallel to the substratesurface, wherein the components are native to the source wafer; a stampcomprising a stamp body and stamp posts extending away from the stampbody and disposed in an array over the stamp body, each of the stampposts having (i) a post location corresponding to a component locationof one of the components when the stamp is disposed in alignment withthe source wafer, and (ii) a post surface extent on a distal end of thestamp post, wherein the post surface extent is greater than thecomponent extent, wherein each of the stamp posts comprises a step andthe step extends laterally beyond each edge of the distal end of thestamp post.